Larg H. Weiland was born in Konstanz, Germany. He received his
diploma degree in physics from the University of Karlsruhe, Germany in 1992,
and the Dr.-Ing. (Ph.D.) degree in computer science from the University of
Karlsruhe, Germany in 1998.
In 1993 Dr. Weiland joined
Institute of Computer Design and Fault Tolerance
at the
University of Karlsruhe.
Currently he is a member of the
Defect Diagnosis Group. His
research interests include physics of defect mechanisms in semiconductor
manufacturing processes and possible measurement procedures to determine them.
He is involved with the microelectronics industry in several areas which include
metalization processing, test chip generation, digital and optical measurements on
test chips and fast defect diagnosis from digital tester data.
Dr. Weiland is member of the IEEE and the
Electron Device Society.
1996 he joined the program committee of the
SPIE's Symposium on Microelectronic
Manufacturing which will be held in Santa Clara, CA, 23-24 September 1998.
In 1998 he joined the International Organizing Committee of the
Symposium on
Microelectronic Manufacturing Technologies, 19-21 May 1999, Caledonian Hotel,
Edinburgh, Scotland, UK.
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