Defect Diagnosis Group


Dr. Larg H. Weiland
c/o Institute of Computer Design and Fault Tolerance
P.O. Box 6980
76128 Karlsruhe, Germany
Phone: +49-721-608-4217
FAX: +49-721-370455
email: Larg.Weiland@informatik.uni-karlsruhe.de

Larg H. Weiland was born in Konstanz, Germany. He received his diploma degree in physics from the University of Karlsruhe, Germany in 1992, and the Dr.-Ing. (Ph.D.) degree in computer science from the University of Karlsruhe, Germany in 1998.

In 1993 Dr. Weiland joined Institute of Computer Design and Fault Tolerance at the University of Karlsruhe. Currently he is a member of the Defect Diagnosis Group. His research interests include physics of defect mechanisms in semiconductor manufacturing processes and possible measurement procedures to determine them. He is involved with the microelectronics industry in several areas which include metalization processing, test chip generation, digital and optical measurements on test chips and fast defect diagnosis from digital tester data. Dr. Weiland is member of the IEEE and the Electron Device Society. 1996 he joined the program committee of the SPIE's Symposium on Microelectronic Manufacturing which will be held in Santa Clara, CA, 23-24 September 1998. In 1998 he joined the International Organizing Committee of the Symposium on Microelectronic Manufacturing Technologies, 19-21 May 1999, Caledonian Hotel, Edinburgh, Scotland, UK.

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© 1998 C. Hess, L. H. Weiland Institute of Computer Design and Fault Tolerance, Karlsruhe