Christopher Hess was born in Wiesbaden, Germany. He received the
diploma degree in electrical engineering from the University of Karlsruhe,
Germany in 1992, and the Dr.-Ing. (Ph.D.) degree in computer science from
the University of Karlsruhe, Germany in 1998.
In 1992 he joined the
Institute of Computer Design and Fault Tolerance at the University of Karlsruhe. Currently
he is a member of the Defect
Diagnosis Group. His research interests include defect detection and
localization techniques as well as defect analysis in semiconductor
manufacturing processes. He is involved with the microelectronics industry in
several areas which include metalization processing, yield enhancement and
microelectronic test structures for the characterization of defects in
integrated circuits.
Dr. Hess is member of the IEEE and the
Electron Device Society.
He is a member of the general committee of the Advanced Semiconducor Manufacturing
Conference (ASMC 98)
which will take place September 23-25, 1998 at Boston, MA.
Dr. Hess is a member of the technical committee of the International Conference on
Microelectronic Test Structures
(ICMTS) which will
take place March 15-18, 1999 at Goteborg, Sweden.
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