Christopher Hess was born in Wiesbaden, Germany. He received the
diploma degree in electrical engineering from the University of Karlsruhe,
Germany in 1992, and the Dr.-Ing. (Ph.D.) degree in computer science from
the University of Karlsruhe, Germany in 1998.
In 1992 he joined the Institute of Computer Design and Fault Tolerance at the University of Karlsruhe. Currently he is a member of the Defect Diagnosis Group. His research interests include defect detection and localization techniques as well as defect analysis in semiconductor manufacturing processes. He is involved with the microelectronics industry in several areas which include metalization processing, yield enhancement and microelectronic test structures for the characterization of defects in integrated circuits. Dr. Hess is member of the IEEE and the Electron Device Society. He is a member of the general committee of the Advanced Semiconducor Manufacturing Conference (ASMC 98) which will take place September 23-25, 1998 at Boston, MA. Dr. Hess is a member of the technical committee of the International Conference on Microelectronic Test Structures (ICMTS) which will take place March 15-18, 1999 at Goteborg, Sweden.
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